Alan Loprete from National Instruments visits the Café and provides an overview of modularized test automation. Time is of the essence in manufacturing and test. By configuring a properly-conceived test architecture, tremendous gains in time and efficiency can be realized. This is even more critical as devices with multiple subsystems—RF, video, high speed I/O functions--get more complicated. By configuring modularly-designed test scenarios testing efficiencies can be realized and the test scenarios can accommodate product evolution. Learn more from Alan and National Instruments. Watch the video here.
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